We are pleased to announce a significant contribution from our team at COSADE 2024:
Javad Bahrami, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, and Naghmeh Karimi,
“Impact of Process Mismatch and Device Aging on SR-Latch Based True Random Number Generators,” COSADE 2024, Lecture Notes in Computer Science vol. 14595, pp. 177–196 (2024).
🔗 Access the paper here: https://doi.org/10.1007/978-3-031-57543-3_10
Key Takeaways:
- Introduces a comprehensive stochastic modeling framework that predicts the average entropy of SR-latch based TRNGs, considering both process mismatch (quantified via a mismatch-to-noise ratio) and device aging.
- Simulations demonstrate no significant loss of entropy over seven years, suggesting inherent robustness of SR-latch TRNGs as reliable sources for cryptographic randomness.
- Highlights the practicality of SR-latch TRNGs for high-throughput, long-term deployment—offering low overhead and sustained performance.
This research strengthens Allegro’s vision for trustworthy, resilient hardware-based security components in advanced communication systems.