We are proud to announce our recent publication in Optics Express:
Joel Winiger, Killian Keller, Patrik Gjini, David Moor, Michael Baumann, Daniel Chelladurai, Manuel Kohli, Raphael Schwanninger, Yuriy Fedoryshyn, Costanzo Tommaso, Ueli Koch, Gabriel Caruntu, and Juerg Leuthold
“Measuring dielectric and electro-optic responses of thin films using plasmonic devices,” Opt. Express, vol. 32, no. 3, pp. 4511–4524 (2024).
🔗 Read the full paper: https://doi.org/10.1364/OE.511747
Highlights:
- Introduces a compact plasmonic waveguide device for concurrent measurement of relative permittivity and Pockels coefficient across a broad frequency range up to sub-THz.
- Proven effective on BTO nanoparticle films:
- Effective permittivity (ε_eff): ~30 at 200 MHz → ~18 at 67 GHz
- Effective Pockels coefficient (r_eff): ~16 at 350 MHz → ~8 at 70 GHz
- Demonstrates high sensitivity and substrate/material versatility, opening avenues for rapid characterization of diverse EO materials.